Title :
Studies of semitransparent optoelectronic position sensors
Author :
Danielyan, V. ; Horvat, S. ; Kroha, H.
Author_Institution :
Max-Planck-Inst. fur Phys., Munich, Germany
Abstract :
Novel semitransparent optoelectronic position sensors, the ´ALMY sensors,´ have been developed for high-precision multi-point position and angle measurements of collimated laser beams over a large measurement range. The sensors consist of a thin film of amorphous silicon deposited on a glass substrate between two transparent layers of crossed strip electrodes. They provide a position resolution on the order of a micrometer over sensitive areas of several square centimeters. A transmittance of 80-90% has been achieved for 780 nm laser light produced by diode lasers. We report on recent optimizations of the sensor performance and tests of the long-term stability under laser illumination and of the radiation tolerance at high neutron doses. As expected, the radiation hardness of the amorphous silicon sensors exceeds the that of crystalline silicon devices. The custom designed readout electronics allows for operation at sufficiently low laser intensities in order to prevent significant degradation of the performance of the amorphous silicon sensors under illumination with laser light.
Keywords :
amorphous semiconductors; angular measurement; elemental semiconductors; laser beam effects; neutron effects; photodetectors; position measurement; radiation hardening (electronics); readout electronics; semiconductor thin films; silicon; stability; 780 nm; ALMY sensors; Si; amorphous Si thin film; collimated laser beams; custom designed readout electronics; glass substrate; high-precision measurements; laser illumination; long-term stability; multi-point angle measurements; multi-point position measurements; neutron irradiation; optical alignment monitoring systems; radiation hardness; radiation tolerance; semitransparent optoelectronic position sensors; transparent crossed strip electrodes; Amorphous silicon; Collimators; Goniometers; Laser beams; Laser stability; Lighting; Optoelectronic and photonic sensors; Position measurement; Semiconductor thin films; Thin film sensors;
Conference_Titel :
Sensors, 2002. Proceedings of IEEE
Print_ISBN :
0-7803-7454-1
DOI :
10.1109/ICSENS.2002.1037214