DocumentCode :
2313305
Title :
Interconnect Slew Metric Using Nakagami-M Distribution
Author :
Gupta, S. ; Chattaraj, A. ; Kar, R. ; Mal, A.K.
Author_Institution :
Dept. of Electron. & Commun. Eng., Nat. Inst. of Technol., Durgapur
fYear :
2008
fDate :
16-18 July 2008
Firstpage :
400
Lastpage :
403
Abstract :
Slew rate determines the ability of a device to handle the varying signals. Determination of the slew rate to a good proximity is thus essential for efficient design of high speed CMOS integrated circuits. This in turn reduces the output switching surges in the device. Interconnect slew has become a crucial bottleneck for any high density and high speed VLSI circuits. In this paper we have proposed an accurate and efficient model to compute the slew metric of on chip interconnect of high speed CMOS VLSI deigns. Our slew metric is based on the Nakagami-M distribution function. Comparison of simulation results with other established models justifies the accuracy of our slew approach.
Keywords :
CMOS integrated circuits; Nakagami channels; VLSI; integrated circuit design; CMOS VLSI deign; CMOS integrated circuit; Nakagami-M distribution function; VLSI circuit; slew interconnection; CMOS integrated circuits; CMOS technology; Delay estimation; Design optimization; Integrated circuit interconnections; Integrated circuit technology; Nakagami distribution; Semiconductor device modeling; Surges; Very large scale integration; Interconnect; Probability distribution function; Slew metric; VLSI;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging Trends in Engineering and Technology, 2008. ICETET '08. First International Conference on
Conference_Location :
Nagpur, Maharashtra
Print_ISBN :
978-0-7695-3267-7
Electronic_ISBN :
978-0-7695-3267-7
Type :
conf
DOI :
10.1109/ICETET.2008.12
Filename :
4579932
Link To Document :
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