Title :
Stochastic Estimation of Balanced and Unbalanced Voltage Sags in Large System
Author :
Goswami, Arup Kumar ; Gupta, Chandra Prakash ; Singh, G.K.
Author_Institution :
Dept. of Electr. Eng., IIT Roorkee, Roorkee
Abstract :
This paper presents an analytical method for stochastic prediction of magnitude and number of voltage sags caused by short-circuit fault in power systems. The method represents the expression of voltage sag magnitude as a continuous function of distance to the fault. The mathematical formulation of the proposed method has been applied to the IEEE 30-bus Reliability Test System to illustrate its application.
Keywords :
mathematical analysis; power supply quality; power system faults; power system reliability; stochastic processes; IEEE 30-bus Reliability Test System; balanced-unbalanced voltage sags; large system; mathematical formulation; short-circuit fault; stochastic estimation; Circuit faults; Costs; Impedance; Monitoring; Power quality; Power system reliability; Stochastic processes; Stochastic systems; System testing; Voltage fluctuations; Balanced and Unbalanced fault; fault distribution; stochastic techniques; voltage sag;
Conference_Titel :
Emerging Trends in Engineering and Technology, 2008. ICETET '08. First International Conference on
Conference_Location :
Nagpur, Maharashtra
Print_ISBN :
978-0-7695-3267-7
Electronic_ISBN :
978-0-7695-3267-7
DOI :
10.1109/ICETET.2008.42
