• DocumentCode
    2313473
  • Title

    SOG micromechanical resonator utilizing single crystal Si and CMOS ASIC

  • Author

    Chiu, Sheng-Ren ; Chen, Jen-Yi ; Lin, Shih-Chieh ; Teng, Li-Tao ; Lin, Shih-Ting ; Shiau, Jieh-Ling ; Hsu, Yu-Wen ; Su, Yan-Kuin

  • Author_Institution
    Microsyst. Technol. Center, Ind. Technol. Res. Inst., Hsinchu, Taiwan
  • fYear
    2010
  • fDate
    20-22 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, a micromechanical resonator utilizing single crystal Si and CMOS ASIC is presented. First, the critical parameters are optimized by theoretical calculation and fine tuned by finite-element-analysis (FEM). Then, SOG-bulk micromachining and deep reactive ion etching (DRIE) are adopted to fabricate the resonator as well as a glass wafer is used as the substrate to support the device, metal interconnections and signal I/O. The structure size of the designed resonator is 0.46 mm × 0.34 mm with 3 um minimum gap. Finally, a modified pierce oscillator ASIC and a temperature compensative methodology is developed to accomplish fully integrated reference oscillator design.
  • Keywords
    CMOS integrated circuits; application specific integrated circuits; elemental semiconductors; finite element analysis; integrated circuit interconnections; micromachining; micromechanical resonators; oscillators; silicon; sputter etching; CMOS ASIC; SOG bulk micromachining; SOG micromechanical resonator; deep reactive ion etching; finite element analysis; integrated reference oscillator; metal interconnections; pierce oscillator ASIC; signal I/O; single crystal silicon; Application specific integrated circuits; CMOS integrated circuits; Crystals; Glass; Micromechanical devices; Oscillators; Resonant frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4244-9783-6
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2010.5699631
  • Filename
    5699631