DocumentCode
2313487
Title
Performance Evaluation and Comparison and Improvement of Standard Cell Placement Techniques in VLSI Design
Author
Bunglowala, Aaquil ; Singhi, B.M.
Author_Institution
Dept. of Electron. & Commun., Sanghvi Inst. of Mangt. & Sci, Indore
fYear
2008
fDate
16-18 July 2008
Firstpage
468
Lastpage
473
Abstract
Heuristic approach is preferred as a solution to optimization of Non-Deterministic Polynomial hard (NP-hard) problems of sizes that are nontrivial because of speed limitations of exact optimization methods. This paper, therefore, proposes to investigate recent heuristic techniques for solving the standard cell placement problems at physical design stage of VLSI design cycle. The techniques considered are Simulated Annealing (SA), Hopfield Neural Network and Genetic Algorithm (GA). In addition to individual studies of the methods, we compare them in terms of solution quality and computing speed in connection with the standard cell placement problems. Finally we shall suggest a method to enhance them using Memetic Algorithms (MA).
Keywords
Hopfield neural nets; VLSI; circuit layout CAD; genetic algorithms; integrated circuit layout; logic CAD; microprocessor chips; simulated annealing; Hopfield neural network; NP-hard problem; VLSI design; genetic algorithm; heuristic technique; memetic algorithm; nondeterministic polynomial hard problem; optimization; performance evaluation; simulated annealing; standard cell placement technique; Algorithm design and analysis; Circuit testing; Communication standards; Costs; Hopfield neural networks; Integrated circuit interconnections; Process design; Simulated annealing; Time to market; Very large scale integration; Hopfield Neural Network; Memetic Algorithm; NP-hard; Simulated Annealing;
fLanguage
English
Publisher
ieee
Conference_Titel
Emerging Trends in Engineering and Technology, 2008. ICETET '08. First International Conference on
Conference_Location
Nagpur, Maharashtra
Print_ISBN
978-0-7695-3267-7
Electronic_ISBN
978-0-7695-3267-7
Type
conf
DOI
10.1109/ICETET.2008.73
Filename
4579946
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