• DocumentCode
    2313572
  • Title

    Pricing of System Security with Voltage Stability Constraint

  • Author

    De, Mala

  • Author_Institution
    Jadavpur Univ., Kolkata
  • fYear
    2008
  • fDate
    12-15 Oct. 2008
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Deregulation of electric power industry has affected its overall operation, which in turn has altered the pricing strategy. In this paper, we present a suitable pricing system for this emerging environment. The proposed multi-objective OPF gives optimum pricing while incorporating voltage stability, security and reliability constraints. Voltage stability constraint is included to ensure the stability of the system by maintaining a minimum distance of the operating point from the voltage collapse point. Security and reliability constraints are added to the pricing mechanism as cross-subsidy for these services is not allowed in this environment, unlike the monopolistic structure. The effect of contingency and congestion on pricing is also analyzed. The congestion is estimated from the available transfer capability, which is calculated by repeated power flow considering bus voltage and line thermal limit. Finally, the model is tested on IEEE 14-bus and 30-bus systems and also on the North-Eastern India grid.
  • Keywords
    electricity supply industry deregulation; power system security; power system stability; pricing; voltage control; IEEE 14-bus system; IEEE 30-bus system; electric power industry deregulation; reliability constraints; system security pricing; voltage stability; voltage stability constraint; Constraint optimization; ISO; Load flow; Power system modeling; Power system reliability; Power system security; Power system stability; Pricing; System testing; Voltage; Congestion; Deregulation; N-1 contingency; Pricing model; System security; Voltage Stability Constraint;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power System Technology and IEEE Power India Conference, 2008. POWERCON 2008. Joint International Conference on
  • Conference_Location
    New Delhi
  • Print_ISBN
    978-1-4244-1763-6
  • Electronic_ISBN
    978-1-4244-1762-9
  • Type

    conf

  • DOI
    10.1109/ICPST.2008.4745231
  • Filename
    4745231