• DocumentCode
    2313766
  • Title

    Non-idealities of temperature sensors using substrate pnp transistors

  • Author

    Pertijs, Michiel A P ; Meijer, Gerard C M ; Huijsing, Johan H.

  • Author_Institution
    Electron. Instrum. Lab., Delft Univ. of Technol., Netherlands
  • Volume
    2
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    1018
  • Abstract
    This paper describes the nonidealities of temperature sensors based on substrate pnp transistors and shows how their influence can be minimized The effects of series resistance, current-gain variation, high-level injection and the Early effect on the accuracy of the PTAT voltage are discussed. The results of measurements made on substrate pnp transistors in a standard 0.5 μm CMOS process are presented to show the effects of these nonidealities. It is shown that the modeling of the PTAT voltage can be improved by taking the temperature dependency of the effective emission coefficient into account using the reverse Early effect. With this refinement, the temperature can be extracted from the measurement data with an absolute accuracy of ±0.1°C in the range of -50°C to 130°C.
  • Keywords
    CMOS integrated circuits; energy gap; intelligent sensors; reference circuits; temperature sensors; -50 to 130 degC; 0.5 micron; CMOS process; Early effect; PTAT voltage; absolute accuracy; current-gain variation; effective emission coefficient; high-level injection; measurement data; nonidealities; reverse Early effect; series resistance; substrate pnp transistors; temperature dependency; temperature sensors; Bipolar transistors; CMOS process; CMOS technology; Data mining; Measurement standards; Semiconductor device measurement; Temperature distribution; Temperature measurement; Temperature sensors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2002. Proceedings of IEEE
  • Print_ISBN
    0-7803-7454-1
  • Type

    conf

  • DOI
    10.1109/ICSENS.2002.1037251
  • Filename
    1037251