DocumentCode :
2313796
Title :
Effect of low temperature on the micro-impact fracture behavior of Sn-Ag-Cu solder joint
Author :
Liu, D.S. ; Hsu, C.L. ; Kuo, C.Y. ; Huang, Y.L. ; Lin, K.L. ; Shen, G.S.
Author_Institution :
Dept. of Mech. Eng., Nat. Chung Cheng Univ., Chiayi, Taiwan
fYear :
2010
fDate :
20-22 Oct. 2010
Firstpage :
1
Lastpage :
3
Abstract :
In this work, the failure characteristics of lead-free solder joint were investigated with low temperature micro-impact test. A impact testing method with shear rate of 1 m/s and temperatures ranging from room temperature to -40°C was set up to measure the interfacial strength of solder joints for evaluating the reliability. Experimental results have shown that the testing temperatures were found to have strong effects on the impact resistance and fracture mechanisms of Sn-Ag-Cu lead-free solder joint. The failure mode percentage, the peak load, and the energy to peak load under changing low temperature conditions will be presented in this paper.
Keywords :
copper alloys; electronics packaging; fracture; impact testing; silver alloys; solders; tin alloys; impact testing method; lead-free solder joint; low temperature; micro-impact fracture behavior; Lead; Scanning electron microscopy; Soldering; Temperature; Temperature control; Temperature measurement; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
Conference_Location :
Taipei
ISSN :
2150-5934
Print_ISBN :
978-1-4244-9783-6
Electronic_ISBN :
2150-5934
Type :
conf
DOI :
10.1109/IMPACT.2010.5699648
Filename :
5699648
Link To Document :
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