• DocumentCode
    2314099
  • Title

    Mechanical analysis of Ultra-Thin-Chip-on-Flex (UTCOF) with anisotropic conductive adhesive (ACA) joints

  • Author

    Cheng, Hsien-Chie ; Ma, Jian-Hao ; Fang, Jiunn ; Lu, Su-Tsai

  • Author_Institution
    Dept. of Aerosp. & Syst. Eng., Feng Chia Univ., Taichung, Taiwan
  • fYear
    2010
  • fDate
    20-22 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The work attempts to investigate the thermal-mechanical behaviors of an advanced flexible electronics technology during the bonding process and under four-point bending (FPB) and static bending (SB). The flexible technology implements an epoxy-based anisotropic conductive film (ACF) to form fine-pitch and reliable interconnects of Integrated circuits (IC) bumps on flex substrates. The paper starts from exploring its process-induced thermal-mechanical behaviors through process modeling using a proposed process-dependent simulation methodology. The validity of the process-modeling is confirmed through various experiments. Subsequently, the contact behaviors of the ACF joints in the flexible technology under FPB and SB are also characterized using FE modeling and a four-point probe method. The simulated contact stress is correlated with the measured contact electrical resistance.
  • Keywords
    bending; bonding processes; conductive adhesives; fine-pitch technology; flexible electronics; integrated circuit interconnections; integrated circuit manufacture; thermodynamics; ACA joint; ACF; FE modeling; FPB; SB; UTCOF; anisotropic conductive adhesive joint; electronics technology; epoxy-based anisotropic conductive film; fine-pitch; four-point bending; integrated circuits; process-dependent simulation methodology; process-induced thermal-mechanical behavior; static bending; ultra-thin-chip-on-flex;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4244-9783-6
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2010.5699665
  • Filename
    5699665