• DocumentCode
    2314120
  • Title

    Spectacular epitaxial growth of (Cu, Ni)6Sn5 formed on Ni substrate

  • Author

    Chen, W.M. ; Kao, C.R.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2010
  • fDate
    20-22 Oct. 2010
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The texture as well as epitaxial growth of intermetallic compounds (IMCs) are becoming important issues, due to increases in IMCs-solder ratios in the development of micro-bumping. (Cu, Ni)6Sn5 formed on Ni substrate didn´t simply grow in an unexpected manner, but did so, producing a spectacular morphology. Even in the presence of very few Ni atoms dissolved in (Cu, Ni)6Sn5, a strongly preferential orientation growth was still observed. The crystal orientation relationships between (Cu, Ni)6Sn5 and Ni was recognized as: (12̅0)(Cu, Ni)6Sn5||(11̅1)Ni; [001](Cu, Ni)6Sn5||[110]Ni, according to EBSD and TEM analysis. The outcome of this study explicitly demonstrates that the morphology of (Cu, Ni)6Sn5 is determined by the preferred orientation relationship with Ni, and therefore one could predict the morphological texture of (Cu, Ni)6Sn5, once the crystal orientations of Ni were known. Moreover, because a coherent interface between (Cu, Ni)6Sn5 and Ni was observed, this study also verified that no (Ni, Cu)3Sn4 IMCs had formed at the interface of (Cu, Ni)6Sn5/Ni.
  • Keywords
    annealing; copper alloys; crystal orientation; epitaxial growth; metallic epitaxial layers; nickel alloys; tin alloys; transmission electron microscopy; Cu6Sn5; Ni; Ni substrate; Ni6Sn5; TEM; annealing; crystal orientation; epitaxial growth; intermetallic compounds; texture; Annealing; Copper; Diffraction; Lattices; Morphology; Nickel; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4244-9783-6
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2010.5699667
  • Filename
    5699667