• DocumentCode
    2314130
  • Title

    Measured Impedance by Distance Relay in Presence of Resistive Fault Current Limiter

  • Author

    Jamali, S. ; Shateri, H.

  • Author_Institution
    Dept. of Electr. Eng., Iran Univ. of Sci. & Technol. (IUST), Tehran
  • fYear
    2008
  • fDate
    12-15 Oct. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Distance relays are widely in use as main and back-up protective devices for transmission lines. Their operation is based on impedance measurement at the relaying point, which can be affected by several factors. Continued demand for electricity energy leads to increase in the short circuit levels along the network, which itself causes new problems. One of the proposed solutions for this problem is the utilization of fault current limiter (FCL), which imposes further changes on the measured impedance at the relaying point. This paper presents the effects of resistive superconductor FCL, on the measured impedance at the relaying point. In addition to its limitation degree, its installation point also affects the measured impedance. The variation of the ideal tripping characteristic due to presence of FCL for different installation points would be investigated.
  • Keywords
    fault current limiters; power transmission lines; power transmission protection; relay protection; superconducting devices; back-up protective devices; distance relay; measured impedance; resistive fault current limiter; resistive superconductor fault current limiter; transmission lines; Current measurement; Distributed parameter circuits; Fault current limiters; Impedance measurement; Power transmission lines; Protection; Protective relaying; Relays; Superconducting transmission lines; Transmission line measurements; Distance protection; FCL; Fault resistance; Ideal tripping characteristic; Measured impedance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power System Technology and IEEE Power India Conference, 2008. POWERCON 2008. Joint International Conference on
  • Conference_Location
    New Delhi
  • Print_ISBN
    978-1-4244-1763-6
  • Electronic_ISBN
    978-1-4244-1762-9
  • Type

    conf

  • DOI
    10.1109/ICPST.2008.4745268
  • Filename
    4745268