• DocumentCode
    2314145
  • Title

    Comprehensive design considerations in die-package-board transceiver channel co-simulation

  • Author

    Jiang, Xiaohong ; Shi, Hong ; Chan, Allen

  • Author_Institution
    Altera Corp., San Jose, CA, USA
  • fYear
    2010
  • fDate
    20-22 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper addresses various challenges and considerations associated with high-speed serial link designs. As data rates increase, the importance of assessing overall channel performance grows. Silicon-package-board co-design that considers both frequency and time domain budgets is essential for robust implementation capable of accommodating anticipated channel degradation and achieving time-to-market goals. This paper focuses on a design methodology that can translate package/board transceiver channel loss, cross talk and power supply noise into system jitter degradation, which is a significant factor in the design of almost all communications links such as PCI Express, Ethernet, XAUI, Interlaken, etc. The paper will outline the analysis, modeling, simulation and characterization employed in the electrical design.
  • Keywords
    electronics packaging; elemental semiconductors; jitter; peripheral interfaces; silicon; telecommunication channels; transceivers; Ethernet; Interlaken; PCI Express; XAUI; channel degradation; channel loss; communications links; comprehensive design considerations; crosstalk; die-package-board transceiver channel cosimulation; high-speed serial link designs; power supply noise; silicon-package-board codesign; time-to-market goals; Fabrics; Jitter; Noise; Power supplies; Semiconductor device measurement; Transceivers; Design methodology; jitter; packaging; power distribution network; system analysis and design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4244-9783-6
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2010.5699669
  • Filename
    5699669