Title :
Craziness based and Velocity Relaxed Swarm Optimized Intelligent PID Controlled AVR System
Author :
Mukherjee, V. ; Ghoshal, S.P.
Author_Institution :
Electr. Eng. Dept., Asansol Eng. Coll., Asansol
Abstract :
This paper explores a comparative performance study of two new classes of particle swarm optimization (PSO) techniques and binary coded genetic algorithm (GA) applied to the optimization of proportional-integral-derivative (PID) gains of PID-controlled automatic voltage regulator (AVR). The two novel swarm optimization techniques are velocity update relaxation particle swarm optimization (VURPSO) and craziness based particle swarm optimization (CRPSO). Incorporation of velocity-updating relaxation strategy in conventional PSO reduces computational effort and enhances searching ability in VURPSO. Enhanced searching ability in normal PSO is also observed in CRPSO by inclusion of a new velocity updating strategy and craziness. In comparative study, it has been revealed that VURPSO exhibits better transient performance than CRPSO. GA yields suboptimal results. For on-line, off-nominal system operating conditions Takagi Sugeno fuzzy logic (TSFL) has been successfully applied to obtain on-line responses.
Keywords :
fuzzy control; genetic algorithms; particle swarm optimisation; three-term control; voltage regulators; PID-controlled automatic voltage regulator; Takagi Sugeno fuzzy logic; binary coded genetic algorithm; particle swarm optimization; proportional-integral-derivative control; relaxation strategy; velocity relaxed swarm optimized intelligent PID control; Automatic control; Control systems; Fuzzy logic; Genetic algorithms; Particle swarm optimization; Performance gain; Regulators; Three-term control; Velocity control; Voltage; Automatic voltage regulator; PID controller; fuzzy logic; genetic algorithm; particle swarm optimization;
Conference_Titel :
Power System Technology and IEEE Power India Conference, 2008. POWERCON 2008. Joint International Conference on
Conference_Location :
New Delhi
Print_ISBN :
978-1-4244-1763-6
Electronic_ISBN :
978-1-4244-1762-9
DOI :
10.1109/ICPST.2008.4745276