• DocumentCode
    2314257
  • Title

    Global outlook for embedded device packaging

  • Author

    Bauer, Charles E. ; Neuhaus, Herbert J.

  • fYear
    2010
  • fDate
    20-22 Oct. 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Embedding active devices in the circuit board offers improved performance by cutting interconnect parasitics, reliability gains by eliminating wire-bonds and solder-bumps, and reduced cost and size by parts list reduction. Like every new development, these benefits come at a price: altered partitioning & design constraints, disrupted manufacturing logistics, yield management challenges, and rework and repair limitations. Following a brief review of embedded packaging drivers this analysis details the leading commercial and developmental approaches from around the world emphasizing various approaches to overcoming the previously described barriers. Reviews of specific embedded package structures, including GE´s ECBU, Verdant´s Occam, Infineon´s TWLP, Freescale´s RCP, Casio´s EWLP, Shinko´s EOP, and Imbera´s 1MB technologies demonstrate both the power and limitations of these approaches. Practical implementation challenges such as yield management strategies and supply chain restructuring completes the analysis, which concludes with an assessment of the outlook for embedded packaging.
  • Keywords
    electronics packaging; reliability; Casio EWLP; Freescale RCP; GE ECBU; Imbera 1MB technologies; Infmeon TWLP; Shinko EOP; Verdant Occam; altered partitioning; circuit board; design constraints; disrupted manufacturing logistics; embedded device packaging; package structures; repair limitations; rework limitations; solder-bumps elimination; supply chain restructuring; wirebonds elimination; yield management challenges; Assembly; Awards activities; Business; Educational institutions; Integrated circuit interconnections; Packaging; Printed circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4244-9783-6
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2010.5699675
  • Filename
    5699675