DocumentCode
2314257
Title
Global outlook for embedded device packaging
Author
Bauer, Charles E. ; Neuhaus, Herbert J.
fYear
2010
fDate
20-22 Oct. 2010
Firstpage
1
Lastpage
1
Abstract
Embedding active devices in the circuit board offers improved performance by cutting interconnect parasitics, reliability gains by eliminating wire-bonds and solder-bumps, and reduced cost and size by parts list reduction. Like every new development, these benefits come at a price: altered partitioning & design constraints, disrupted manufacturing logistics, yield management challenges, and rework and repair limitations. Following a brief review of embedded packaging drivers this analysis details the leading commercial and developmental approaches from around the world emphasizing various approaches to overcoming the previously described barriers. Reviews of specific embedded package structures, including GE´s ECBU, Verdant´s Occam, Infineon´s TWLP, Freescale´s RCP, Casio´s EWLP, Shinko´s EOP, and Imbera´s 1MB technologies demonstrate both the power and limitations of these approaches. Practical implementation challenges such as yield management strategies and supply chain restructuring completes the analysis, which concludes with an assessment of the outlook for embedded packaging.
Keywords
electronics packaging; reliability; Casio EWLP; Freescale RCP; GE ECBU; Imbera 1MB technologies; Infmeon TWLP; Shinko EOP; Verdant Occam; altered partitioning; circuit board; design constraints; disrupted manufacturing logistics; embedded device packaging; package structures; repair limitations; rework limitations; solder-bumps elimination; supply chain restructuring; wirebonds elimination; yield management challenges; Assembly; Awards activities; Business; Educational institutions; Integrated circuit interconnections; Packaging; Printed circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
Conference_Location
Taipei
ISSN
2150-5934
Print_ISBN
978-1-4244-9783-6
Electronic_ISBN
2150-5934
Type
conf
DOI
10.1109/IMPACT.2010.5699675
Filename
5699675
Link To Document