Title :
A Path-Oriented Timing-Aware Diagnosis Methodology of At-Speed Transition Tests
Author :
Zeng, Jing ; Wang, Jing ; Mateja, Michael
Author_Institution :
Adv. Micro Devices, Austin, TX, USA
Abstract :
Speed path identification is an indispensable step for pushing the design timing wall. We propose a new at-speed diagnosis methodology. Key characteristics of the methodology are (a) path-oriented diagnosis, (b) failing frequency guided, and (d) identified speed paths referenced in the timing verification design database. We demonstrate the effectiveness of our technique on a quad-core AMD Opteron¿ Processor.
Keywords :
fault diagnosis; logic design; logic testing; microprocessor chips; timing; at-speed diagnosis methodology; at-speed transition test; design timing wall; failing frequency guided; identified speed path; path-oriented timing-aware diagnosis; quad-core AMD Opteron processor; speed path identification; timing verification design database; Automatic test pattern generation; Circuits; Cost function; Fault diagnosis; Predictive models; Semiconductor device measurement; Silicon; Testing; Timing; Velocity measurement; at-speed logic diagnosis; general speed path profiling; path-oriented approach;
Conference_Titel :
Microprocessor Test and Verification (MTV), 2009 10th International Workshop on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-6479-1
Electronic_ISBN :
1550-4093
DOI :
10.1109/MTV.2009.21
