• DocumentCode
    2314795
  • Title

    Mutation Operators for Concurrent SystemC Designs

  • Author

    Sen, Alper

  • Author_Institution
    Dept. of Comput. Eng., Bogazici Univ., Istanbul, Turkey
  • fYear
    2009
  • fDate
    7-9 Dec. 2009
  • Firstpage
    27
  • Lastpage
    31
  • Abstract
    Functional design verification is the task of establishing that a given design accurately implements the intended functional behavior. Today, design verification has grown to dominate the cost of electronic system design, however, designs continue to be released with latent bugs. System level modeling is commonly used for designing concurrent SoCs in the industry. SystemC is the most popular concurrent system level description language. Non-determinism and concurrency problems such as starvation, interference and deadlock make it harder to verify concurrent programs than sequential programs. We plan to use mutation testing for verification of SystemC designs. Mutation testing is a fault injection based verification technique and has successfully been used in software testing. In this paper, we propose a fault model by developing mutation operators for concurrent SystemC designs. We aim to reap benefits of mutation testing for SystemC.
  • Keywords
    C language; concurrency control; electronic design automation; program testing; program verification; software fault tolerance; specification languages; system-on-chip; concurrent SoC; concurrent SystemC designs; concurrent programs; concurrent system level description language; electronic system design; fault injection; fault model; functional design verification; latent bugs; mutation operators; mutation testing; sequential programs; software testing; system level modeling; verification technique; Computer bugs; Concurrent computing; Costs; Genetic mutations; Hardware; Microprocessors; Power system modeling; Software testing; System testing; System-level design; SystemC; concurrency; mutation testing; verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocessor Test and Verification (MTV), 2009 10th International Workshop on
  • Conference_Location
    Austin, TX
  • ISSN
    1550-4093
  • Print_ISBN
    978-1-4244-6479-1
  • Electronic_ISBN
    1550-4093
  • Type

    conf

  • DOI
    10.1109/MTV.2009.8
  • Filename
    5460814