DocumentCode
2314816
Title
On the Mutation Analysis of SystemC TLM-2.0 Standard
Author
Bombieri, Nicola ; Fummi, Franco ; Pravadelli, Graziano
Author_Institution
Dept. of Comput. Sci., Univ. of Verona, Verona, Italy
fYear
2009
fDate
7-9 Dec. 2009
Firstpage
32
Lastpage
37
Abstract
Transaction-level modeling (TLM) is the most promising technique to deal with the increasing complexity of modern embedded systems. TLM provides designers with high-level interfaces and communication protocols for abstract modeling and efficient simulation of system platforms involving both hardware and software components. The Open SystemC Initiative (OSCI) has recently released the TLM-2.0 standard, to standardize the interface between component models for bus-based systems. The standard TLM aims at facilitating the interchange of models between suppliers and users, and thus encouraging the use of virtual platforms for fast simulation prior to the availability of register-transfer level (RTL) code. This paper discusses on the mutation analysis concept applied to the TLM context and proposes a mutation model for perturbing TLM SystemC descriptions. In particular, the main constructs provided by the latest OSCI TLM-2.0 standard are analyzed, and a set of mutants is proposed to perturb the primitives related to the TLM communication interfaces.
Keywords
computer interfaces; embedded systems; hardware description languages; hardware-software codesign; transaction processing; OSCI TLM-2.0 standard; TLM SystemC descriptions; TLM communication interfaces; abstract modeling; communication protocols; embedded systems; hardware-software design; mutation analysis; register transfer level code; transaction level modeling; Communication standards; Digital systems; Genetic mutations; Hardware; Performance analysis; Process design; Proposals; Protocols; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocessor Test and Verification (MTV), 2009 10th International Workshop on
Conference_Location
Austin, TX
ISSN
1550-4093
Print_ISBN
978-1-4244-6479-1
Electronic_ISBN
1550-4093
Type
conf
DOI
10.1109/MTV.2009.17
Filename
5460815
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