DocumentCode
2315026
Title
A New Approach to Compute Transient Behavior of Grounding Electrodes in Time-Domain
Author
Shahrtash, S.M. ; Ramezani, N.
Author_Institution
Center of Excellence for Power Syst. Autom. & Oper., Iran Univ. of Sci. & Technol., Tehran
fYear
2008
fDate
12-15 Oct. 2008
Firstpage
1
Lastpage
5
Abstract
In this paper, based on the electromagnetic field theory in frequency domain and by using the full set of Maxwell´s equations, an exact numerical method is presented to calculate the high frequency characteristics of electrodes excited by high frequency sources such as lightning, faults etc. In this method, the effect of ground-reflected waves which exist due to the boundary between earth (lossy medium) and air have been considered according to the modified image theory that includes a modified reflection coefficient (RC) instead of solving the Sommerfeld integral in the high frequency formulation of the Green function. In addition, the transient voltages in time domain are calculated applying fast inverse-Laplace transform technique (FILT) to the frequency response of the grounding electrode.
Keywords
Green´s function methods; Laplace transforms; Maxwell equations; earth electrodes; electromagnetic field theory; frequency response; frequency-domain analysis; transient analysis; Green function; Maxwell equations; Sommerfeld integral; electromagnetic field theory; fast inverse-Laplace transform technique; frequency response; ground-reflected waves; grounding electrodes; high frequency sources; reflection coefficient; time-domain; transient behavior; Electrodes; Electromagnetic field theory; Electromagnetic transients; Frequency domain analysis; Grounding; Integral equations; Lightning; Maxwell equations; Optical reflection; Time domain analysis; Computer modeling; Electromagnetic field calculation method; Grounding system; High frequency performance;
fLanguage
English
Publisher
ieee
Conference_Titel
Power System Technology and IEEE Power India Conference, 2008. POWERCON 2008. Joint International Conference on
Conference_Location
New Delhi
Print_ISBN
978-1-4244-1763-6
Electronic_ISBN
978-1-4244-1762-9
Type
conf
DOI
10.1109/ICPST.2008.4745321
Filename
4745321
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