• DocumentCode
    231513
  • Title

    Embedded Model Control: Design separation under uncertainty

  • Author

    Canuto, Enrico ; Perez Montenegro, Carlos ; Colangelo, Luigi ; Lotufo, Mauricio

  • Author_Institution
    Dipt. di Autom. e Inf., Politec. di Torino, Turino, Italy
  • fYear
    2014
  • fDate
    28-30 July 2014
  • Firstpage
    3637
  • Lastpage
    3643
  • Abstract
    The key signal of the Embedded Model Control (EMC) is the model error, measured minus model output, which is used by Internal Model Control and in a more efficient way by Active Disturbance Rejection Control (ADRC). EMC extends ADRC along four lines: a generic disturbance dynamics, design of the noise layout (where uncertainty enters the model), dynamic uncertainty estimation, a design degree of freedom similar to Youla parameterization. The latter freedom is shown to favor separation between control and estimation under uncertainty, a principle hidden in ADRC. As a result, control law can be practically designed model-based, only limited by command saturation. The main theorems are developed in some detail starting from two model classes (design and embedded model), that are essential to define uncertainty. The paper extends part of previous results from SISO to MIMO systems, but some theorems and the free feedback dynamics are original. Theory is accompanied by a study case.
  • Keywords
    MIMO systems; active disturbance rejection control; control system synthesis; feedback; uncertain systems; ADRC; EMC; MIMO systems; SISO systems; Youla parameterization; active disturbance rejection control; control law; design separation; dynamic uncertainty estimation; embedded model control; feedback dynamics; generic disturbance dynamics; internal model control; minus model output; model error; noise layout design; Electromagnetic compatibility; Equations; Estimation; Mathematical model; Noise; Stability analysis; Uncertainty; embedded model control; noise estimator; separation theorem; uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control Conference (CCC), 2014 33rd Chinese
  • Conference_Location
    Nanjing
  • Type

    conf

  • DOI
    10.1109/ChiCC.2014.6895544
  • Filename
    6895544