• DocumentCode
    2315145
  • Title

    Detection of terahertz radiation by AlGaN/GaN field-effect transistors

  • Author

    Ortolani, M. ; Di Gaspare, A. ; Giovine, E. ; Evangelisti, F. ; Foglietti, V. ; Doria, A. ; Gallerano, G.P. ; Giovenale, E. ; Messina, G. ; Spassovsky, I. ; Coppa, A. ; Lanzieri, C. ; Peroni, M. ; Cetronio, A. ; Sakowicz, M. ; Knap, W.

  • Author_Institution
    CNR, Ist. di Fotonica e Nanotecnol., Rome, Italy
  • fYear
    2009
  • fDate
    21-25 Sept. 2009
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    High electron mobility transistors can work as room-temperature direct detectors of radiation at frequency much higher than their cutoff frequency. One open issue is how the radiation couples to the sub-wavelength transistor channel. Here, we studied the coupling of radiation to an AlGaN/GaN transistor with cut-off frequency of 30 GHz. Local irradiation with a free electron laser source at 0.15 THz allowed us to selectively couple the signal to the channel through one transistor terminal at a time. Far-field experiments at 0.15-0.94 THz were also performed in order to study the nonlinear properties of the transistor channel.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; terahertz wave detectors; wide band gap semiconductors; AlGaN-GaN; field-effect transistor; free electron laser source; frequency 0.15 THz to 0.94 THz; frequency 30 GHz; high electron mobility transistor; nonlinear properties; room-temperature direct detector; sub-wavelength transistor channel; temperature 293 K to 298 K; terahertz radiation detection; Aluminum gallium nitride; Cutoff frequency; FETs; Free electron lasers; Gallium nitride; HEMTs; Laser beam cutting; MODFETs; Optical coupling; Radiation detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
  • Conference_Location
    Busan
  • Print_ISBN
    978-1-4244-5416-7
  • Electronic_ISBN
    978-1-4244-5417-4
  • Type

    conf

  • DOI
    10.1109/ICIMW.2009.5324627
  • Filename
    5324627