Title :
All electrical detection of the stokes parameters of IR/THz radiation
Author :
Danilov, Sergey N. ; Wittmann, Bernhard ; Olbrich, Peter ; Prettl, Wilhelm ; Golub, Leonid E. ; Beregulin, Evgeny V. ; Kvon, Ze-Don ; Mikhailov, Nikolay N. ; Dvoretsky, Sergey A. ; Shalygin, Vadim A. ; Vinh, Nguen Q. ; van der Meer, A.F.G. ; Murdin, B. ;
Author_Institution :
Terahertz Center, Univ. of Regensburg, Regensburg, Germany
Abstract :
A fast room temperature pure photoelectrical detection scheme for obtaining the information about polarization ellipticity of laser radiation (described by the Stokes parameters) with a bandwidth from the infrared to the terahertz range is reported. The device consists of two elements, back-to-back, which detect the polarization ellipticity and the ellipse azimuthal angle. The first element utilizes the circular photogalvanic effect in a narrow gap semiconductor and the second the linear photogalvanic effect in a bulk piezoelectric semiconductor. In contrast to optical methods we propose an all-electric approach, which is demonstrated by applying a large number of different laser sources.
Keywords :
infrared detectors; laser variables measurement; light polarisation; narrow band gap semiconductors; photoconductivity; photoelectricity; photoluminescence; piezoelectric semiconductors; terahertz wave detectors; IR/THz radiation; Stokes parameters; bulk piezoelectric semiconductor; circular photogalvanic effect; ellipse azimuthal angle; laser radiation polarization ellipticity; laser sources; linear photogalvanic effect; narrow gap semiconductor; pure photoelectrical detection scheme; room temperature; Azimuthal angle; Bandwidth; Infrared detectors; Optical polarization; Photovoltaic effects; Piezoelectric polarization; Radiation detectors; Semiconductor lasers; Stokes parameters; Temperature distribution;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5416-7
Electronic_ISBN :
978-1-4244-5417-4
DOI :
10.1109/ICIMW.2009.5324632