DocumentCode
2315260
Title
Ambipolar conduction in recessed channel Schottky barrier MOSFETs
Author
Shih, Chun-Hsing ; Yang, Shao-Hui ; Shia, Ruei-Kai ; Chien, Nguyen Dang
Author_Institution
Dept. of Electr. Eng., Nat. Chi Nan Univ., Nantou, Taiwan
fYear
2010
fDate
12-15 Dec. 2010
Firstpage
189
Lastpage
190
Abstract
The ambipolar conduction is numerically studied in recessed channel Schottky barrier MOSFET (RC-SBMOS). The results show that the recessed channel structure can alleviate the lateral field penetrations coming from drain electrode. Thus, it is rather insensitive to the variations of drain voltages. However, the parasitic recessed channel leads to a lower on-state driving current. The depth of the recessed channel must be well designed to have good current characteristics in RC-SBMOS. Importantly, the recessed channel structure has only a mild effect on suppressing the off-state ambipolar hole current.
Keywords
MOSFET; Schottky barriers; ambipolar conduction; current characteristics; drain electrode; drain voltages; lateral field penetrations; off-state ambipolar hole current; on-state driving current; parasitic recessed channel; recessed channel Schottky barrier MOSFET; recessed channel depth; recessed channel structure; CMOS integrated circuits; Logic gates; MOSFETs; Nanoscale devices; Performance evaluation;
fLanguage
English
Publisher
ieee
Conference_Titel
Optoelectronic and Microelectronic Materials and Devices (COMMAD), 2010 Conference on
Conference_Location
Canberra, ACT
ISSN
1097-2137
Print_ISBN
978-1-4244-7334-2
Electronic_ISBN
1097-2137
Type
conf
DOI
10.1109/COMMAD.2010.5699732
Filename
5699732
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