Title :
Ambipolar conduction in recessed channel Schottky barrier MOSFETs
Author :
Shih, Chun-Hsing ; Yang, Shao-Hui ; Shia, Ruei-Kai ; Chien, Nguyen Dang
Author_Institution :
Dept. of Electr. Eng., Nat. Chi Nan Univ., Nantou, Taiwan
Abstract :
The ambipolar conduction is numerically studied in recessed channel Schottky barrier MOSFET (RC-SBMOS). The results show that the recessed channel structure can alleviate the lateral field penetrations coming from drain electrode. Thus, it is rather insensitive to the variations of drain voltages. However, the parasitic recessed channel leads to a lower on-state driving current. The depth of the recessed channel must be well designed to have good current characteristics in RC-SBMOS. Importantly, the recessed channel structure has only a mild effect on suppressing the off-state ambipolar hole current.
Keywords :
MOSFET; Schottky barriers; ambipolar conduction; current characteristics; drain electrode; drain voltages; lateral field penetrations; off-state ambipolar hole current; on-state driving current; parasitic recessed channel; recessed channel Schottky barrier MOSFET; recessed channel depth; recessed channel structure; CMOS integrated circuits; Logic gates; MOSFETs; Nanoscale devices; Performance evaluation;
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices (COMMAD), 2010 Conference on
Conference_Location :
Canberra, ACT
Print_ISBN :
978-1-4244-7334-2
Electronic_ISBN :
1097-2137
DOI :
10.1109/COMMAD.2010.5699732