• DocumentCode
    2315260
  • Title

    Ambipolar conduction in recessed channel Schottky barrier MOSFETs

  • Author

    Shih, Chun-Hsing ; Yang, Shao-Hui ; Shia, Ruei-Kai ; Chien, Nguyen Dang

  • Author_Institution
    Dept. of Electr. Eng., Nat. Chi Nan Univ., Nantou, Taiwan
  • fYear
    2010
  • fDate
    12-15 Dec. 2010
  • Firstpage
    189
  • Lastpage
    190
  • Abstract
    The ambipolar conduction is numerically studied in recessed channel Schottky barrier MOSFET (RC-SBMOS). The results show that the recessed channel structure can alleviate the lateral field penetrations coming from drain electrode. Thus, it is rather insensitive to the variations of drain voltages. However, the parasitic recessed channel leads to a lower on-state driving current. The depth of the recessed channel must be well designed to have good current characteristics in RC-SBMOS. Importantly, the recessed channel structure has only a mild effect on suppressing the off-state ambipolar hole current.
  • Keywords
    MOSFET; Schottky barriers; ambipolar conduction; current characteristics; drain electrode; drain voltages; lateral field penetrations; off-state ambipolar hole current; on-state driving current; parasitic recessed channel; recessed channel Schottky barrier MOSFET; recessed channel depth; recessed channel structure; CMOS integrated circuits; Logic gates; MOSFETs; Nanoscale devices; Performance evaluation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optoelectronic and Microelectronic Materials and Devices (COMMAD), 2010 Conference on
  • Conference_Location
    Canberra, ACT
  • ISSN
    1097-2137
  • Print_ISBN
    978-1-4244-7334-2
  • Electronic_ISBN
    1097-2137
  • Type

    conf

  • DOI
    10.1109/COMMAD.2010.5699732
  • Filename
    5699732