Title :
Proceedings of IEEE International Electron Devices Meeting [Front Cover]
Abstract :
Presents the front cover from the conference proceedings.
Keywords :
heterojunction bipolar transistors; integrated circuit technology; semiconductor device models; semiconductor devices; semiconductor process modelling; semiconductor storage; semiconductor technology; semiconductor-insulator boundaries; FPGAs; HEMT device; HV devices; IR detectors; advanced CMOS; bipolar devices; bipolar technology; flash memories; linear beam devices; memory technology; micromachined sensors; photonic devices; semiconductor device simulation; vacuum microelectronics;
Conference_Titel :
Electron Devices Meeting, 1993. IEDM '93. Technical Digest., International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-1450-6
DOI :
10.1109/IEDM.1993.347413