Low level optical feedback in semiconductor lasers as a tool to identify nonlinear enhancement of device noise

Author

Toomey, J.P. ; Kane, D.M.

Author_Institution

Dept. of Phys. & Astron., Macquarie Univ., Sydney, NSW, Australia

fYear

2010

fDate

12-15 Dec. 2010

Firstpage

55

Lastpage

56

Abstract

Recent studies of nonlinear dynamics in semiconductor-laser-with-optical-feedback (SLwOF) systems have discovered that very low levels of optical feedback enhance several, specific, narrow frequency bands within the broad bandwidth of the noise of the free running laser, in a systematic way as the injection current is increased. Similar frequency features are also extracted when completing instantaneous frequency measurement (IFM) on the real-time output power data from semiconductor lasers operated at low injection current. We report further investigation of the nonlinear behaviour of these noise peaks in a SLwOF system and their relevance as driving frequencies in the nonlinear dynamics of the SLwOF systems. The significance of this nonlinear noise measurement to device specification is also evaluated.

Keywords

frequency measurement; laser feedback; laser noise; laser variables measurement; noise measurement; nonlinear optics; semiconductor lasers; injection current; instantaneous frequency measurement; nonlinear dynamics; nonlinear noise measurement; real-time output power; semiconductor-laser-with-optical-feedback system; Frequency modulation; Integrated optics; Logic gates; Optical modulation; Optical variables measurement; Photonics; Semiconductor device measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Optoelectronic and Microelectronic Materials and Devices (COMMAD), 2010 Conference on

Conference_Location

Canberra, ACT

ISSN

1097-2137

Print_ISBN

978-1-4244-7334-2

Electronic_ISBN

1097-2137

Type

conf

DOI

10.1109/COMMAD.2010.5699776

Filename

5699776