Title :
Viewing the nanoworld in infrared/THz light
Author_Institution :
Max Planck Inst. for Quantum Opt., Garching, Germany
Abstract :
Near-field techniques have overcome the diffraction limit that plagues classical light microscopy. Liberated from this century-long constraint the power of infrared/THz spectroscopy can now be unleashed for material inspection at virtually unlimited spatial resolution. In the competition with electron and atomic-force microscopes infrared/THz nanoscopy has the distinct, valuable advantage of rich spectral contrasts that originate from and thus reveal chemical composition (molecular vibration), structural status (phonons), and conductivity (ions, electrons, and correlated charge carriers).
Keywords :
infrared imaging; infrared spectroscopy; light scattering; microwave photonics; nanophotonics; near-field scanning optical microscopy; spectrochemical analysis; submillimetre wave imaging; terahertz spectroscopy; chemical composition; conductivity; correlated charge carriers; electrons; infrared-THz nanoscopy; infrared-terahertz spectroscopy; ions; material inspection; molecular vibration; nanoworld; phonons; rich spectral contrasts; structural status; terahertz s-SNOM; unlimited spatial resolution; Chemicals; Conducting materials; Conductivity; Diffraction; Electron microscopy; Infrared spectra; Inspection; Phonons; Spatial resolution; Spectroscopy;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5416-7
Electronic_ISBN :
978-1-4244-5417-4
DOI :
10.1109/ICIMW.2009.5324706
