DocumentCode :
2316312
Title :
A 14ns 256kx1 CMOS SRAM with multiple test modes
Author :
Pfermings ; Phelan, C. ; Voss, P. ; Davies, T. ; O´Connell, C. ; Bell, S. ; Salters, R. ; Ontrop, H.
Author_Institution :
Philips Research Laboratories
fYear :
1988
fDate :
0-0 1988
Firstpage :
41
Lastpage :
42
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 1988. Digest of Technical Papers., 1988 Symposium on
Conference_Location :
Tokyo, Japan
Type :
conf
DOI :
10.1109/VLSIC.1988.1037414
Filename :
1037414
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2316312
