• DocumentCode
    2316467
  • Title

    Measurement of linearity in THz-TDS

  • Author

    Withayachumnankul, Withawat ; Ung, Benjamin S Y ; Fischer, Bernd M. ; Abbott, Derek

  • Author_Institution
    Dept. of Inf. Eng., King Mongkut´´s Inst. of Technol. Ladkrabang, Bangkok, Thailand
  • fYear
    2009
  • fDate
    21-25 Sept. 2009
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    This article presents an approach to the measurement of the amplitude linearity in terahertz time-domain spectroscopy (THz-TDS) systems. The approach exploits a single wafer of high-purity float-zone silicon to produce multiple Fabry-Perot reflections, which are stepwise attenuated and delayed. Comparison between the theoretical and experimental results can indicate a deviation in linearity.
  • Keywords
    interference spectrometers; silicon; terahertz spectroscopy; time-domain analysis; Fabry-Perot reflections; THz-TDS; high-purity float-zone silicon; linearity measurement; terahertz time-domain spectroscopy systems; Calibration; Dielectrics; Electromagnetic measurements; Linearity; Optical devices; Optical reflection; Silicon; Slabs; Submillimeter wave measurements; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
  • Conference_Location
    Busan
  • Print_ISBN
    978-1-4244-5416-7
  • Electronic_ISBN
    978-1-4244-5417-4
  • Type

    conf

  • DOI
    10.1109/ICIMW.2009.5324721
  • Filename
    5324721
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2316467