DocumentCode :
2316494
Title :
Enhanced implication for automatic test pattern generation
Author :
Hamilton
Author_Institution :
NEC Corporation
fYear :
1988
fDate :
0-0 1988
Firstpage :
69
Lastpage :
70
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 1988. Digest of Technical Papers., 1988 Symposium on
Conference_Location :
Tokyo, Japan
Type :
conf
DOI :
10.1109/VLSIC.1988.1037427
Filename :
1037427
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2316494
