Title :
The influence of surface roughness on THz reflection measurements
Author :
Herrmann, Michael ; Wiegand, Christian ; Jonuscheit, Joachim ; Beigang, René
Author_Institution :
Fraunhofer Inst. for Phys. Meas. Tech. IPM, Kaiserslautern, Germany
Abstract :
In order to improve the performance of THz time-domain spectroscopy for the detection of hazardous substances in the field of civil security, the influence of surface roughness was studied. We performed transmission and reflection measurements of smooth and rough metallic and dielectric surfaces varying the degree of surface roughness and the tilt angle of the sample. The results were compared to calculations based on radar theory with good agreement.
Keywords :
reflectivity; surface roughness; terahertz wave spectra; THz reflection measurements; THz time-domain spectroscopy; civil security; dielectric surfaces; hazardous substances detection; metallic surfaces; radar theory; surface roughness; transmission mesurements; Dielectric measurements; Frequency; Optical reflection; Radar theory; Reflectivity; Rough surfaces; Security; Spectroscopy; Surface roughness; Surface waves; roughness; spectrometry; standoff identification; terahertz; time-domain reflectometry;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5416-7
Electronic_ISBN :
978-1-4244-5417-4
DOI :
10.1109/ICIMW.2009.5324726
