The influence of surface roughness on THz reflection measurements

Author

Herrmann, Michael ; Wiegand, Christian ; Jonuscheit, Joachim ; Beigang, René

Author_Institution

Fraunhofer Inst. for Phys. Meas. Tech. IPM, Kaiserslautern, Germany

fYear

2009

fDate

21-25 Sept. 2009

Firstpage

1

Lastpage

2

Abstract

In order to improve the performance of THz time-domain spectroscopy for the detection of hazardous substances in the field of civil security, the influence of surface roughness was studied. We performed transmission and reflection measurements of smooth and rough metallic and dielectric surfaces varying the degree of surface roughness and the tilt angle of the sample. The results were compared to calculations based on radar theory with good agreement.

Keywords

reflectivity; surface roughness; terahertz wave spectra; THz reflection measurements; THz time-domain spectroscopy; civil security; dielectric surfaces; hazardous substances detection; metallic surfaces; radar theory; surface roughness; transmission mesurements; Dielectric measurements; Frequency; Optical reflection; Radar theory; Reflectivity; Rough surfaces; Security; Spectroscopy; Surface roughness; Surface waves; roughness; spectrometry; standoff identification; terahertz; time-domain reflectometry;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on

Conference_Location

Busan

Print_ISBN

978-1-4244-5416-7

Electronic_ISBN

978-1-4244-5417-4

Type

conf

DOI

10.1109/ICIMW.2009.5324726

Filename

5324726