DocumentCode

2316599

Title

A 256K CMOS EEPROM with enhanced reliability and testability

Author

Do, J.Y. ; Kim, J.K. ; Lee, H.G. ; Choi, J.D. ; Lim, H.K.

Author_Institution

Samsung Semiconductor Research and Development Center

fYear

1988

fDate

0-0 1988

Firstpage

83

Lastpage

84

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Circuits, 1988. Digest of Technical Papers., 1988 Symposium on

Conference_Location

Tokyo, Japan

Type

conf

DOI

10.1109/VLSIC.1988.1037434

Filename

1037434