Title :
Beam characterization with video imaging systems at the ANL 50 MeV H- beamline
Author :
Yule, T.J. ; Bellinger, F.O. ; Coleman, T.A. ; Faber, M.M. ; Fink, C.L. ; Roche, C.T.
Author_Institution :
Argonne Nat. Lab., IL, USA
Abstract :
Video imaging systems consisting of scintillators, charge-coupled device (CCD) cameras, and in-beam CCD detectors are being used to characterize beams at the Argonne National Laboratory (ANL) 50 MeV H- beamline. The characterization technique consists of placing pinholes, slits, or wires in the beam and viewing the resulting images or shadows on a downstream scintillator or CCD. The images are digitally recorded using a frame grabber and stored in computer memory where they are analyzed to determine Twiss parameters and local beam divergence. Since many of the measurements involve low-intensity beams and require good position resolution, studies have been performed on scintillators to obtain sensitivity and resolution data. Various scintillators, including Rarex, CsI, and CaF2, have been evaluated. An in-beam CCD imager has also been tested
Keywords :
CCD image sensors; hydrogen ions; ion accelerators; ion beams; linear accelerators; negative ions; particle beam diagnostics; scintillation counters; video cameras; 50 MeV; ANL; Argonne National Laboratory; CaF2; CsI; H- beamline; Rarex; Twiss parameters; beam characterization; charge-coupled device cameras; computer memory; frame grabber; in-beam CCD detectors; in-beam CCD imager; local beam divergence; low-intensity beams; pinholes; resolution data; scintillators; slits; video imaging systems; wires; Cameras; Charge coupled devices; Charge-coupled image sensors; Dynamic range; Fluorescence; Image analysis; Laboratories; Optical distortion; Particle beams; Wires;
Conference_Titel :
Particle Accelerator Conference, 1989. Accelerator Science and Technology., Proceedings of the 1989 IEEE
Conference_Location :
Chicago, IL
DOI :
10.1109/PAC.1989.72854
