DocumentCode
2317344
Title
Response uniformity improvement of HgCdTe IRFPA
Author
Kim, Young Ho ; Yang, Keedong ; Park, Jae Hong ; Shin, Myung Sup ; Jung, Han
Author_Institution
i3Syst., Daejeon, South Korea
fYear
2009
fDate
21-25 Sept. 2009
Firstpage
1
Lastpage
2
Abstract
Imaging performance of a state-of-the-art infrared focal plane array (IRFPA) is limited by response uniformity of the array. In this work, the relationship between quantum efficiency and epitaxial layer thickness, which affects the response uniformity of FPA, will be studied both experimentally and theoretically.
Keywords
II-VI semiconductors; cadmium compounds; focal planes; mercury compounds; semiconductor epitaxial layers; HgCdTe; IRFPA response uniformity; epitaxial layer thickness; quantum efficiency; state-of-the-art infrared focal plane array imaging performance; Absorption; Epitaxial layers; Frequency; Infrared imaging; Infrared spectra; Radiative recombination; Size measurement; Substrates; Thickness control; Thickness measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location
Busan
Print_ISBN
978-1-4244-5416-7
Electronic_ISBN
978-1-4244-5417-4
Type
conf
DOI
10.1109/ICIMW.2009.5324780
Filename
5324780
Link To Document