DocumentCode :
2317502
Title :
Topography-driven variations in backscatter strength and depth observed over the Greenland Ice Sheet with InSAR
Author :
Hoen, E. Weber ; Zebker, Howard A.
Author_Institution :
STAR Lab., Stanford Univ., CA, USA
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
470
Abstract :
ERS radar observations of the Greenland Ice Sheet have yielded images characterized by small-scale (~10 km) variations in backscatter. While these variations are associated with topography, they are not due to local incidence angle differences, since the undulations in topography are small enough (~tens of meters in height) that changes in slope amount to less than a degree; moreover the variations are independent of look direction. These variations are then caused by differences in terrain scattering properties. To investigate this phenomenon further, the authors utilize all three products of interferometric processing: phase (for topography), power, and correlation. The correlation images also show these variations. They find that one side of the “hill” has greater backscatter but with less decorrelation due to volume scatter than the other side. Coupled with prevailing wind data, this corresponds to the leeward and windward side, respectively. Through simple modeling of the observed changes in power and correlation, they derive estimates of variations in grain size and accumulation rates, and find a ~40% drop in accumulation between the windward and leeward sides
Keywords :
backscatter; glaciology; hydrological techniques; radar cross-sections; remote sensing by radar; synthetic aperture radar; Greenland Ice Sheet; InSAR; SAR; backscatter strength; correlation; depth; glaciology; ice sheet topography; interferometric processing; measurement technique; phase; polar ice sheet; power; radar remote sensing; synthetic aperture radar; topography-driven variation; Backscatter; Decorrelation; Ice; Laboratories; Radar imaging; Radar scattering; Snow; Surface topography; Synthetic aperture radar interferometry; Thermal factors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-6359-0
Type :
conf
DOI :
10.1109/IGARSS.2000.861599
Filename :
861599
Link To Document :
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