DocumentCode :
2317558
Title :
A multi bit test trigger circuit for Mbit SRAM´s
Author :
Miyaji, F. ; Emort ; Matsuyama, Y. ; Kanaishi, Y. ; Senoh, K. ; Hagiwara, Y.
Author_Institution :
SONY Corp.
fYear :
1989
fDate :
25-27 May 1989
Firstpage :
77
Lastpage :
78
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 1989. Digest of Technical Papers., 1989 Symposium on
Conference_Location :
Kyoto, Japan
Type :
conf
DOI :
10.1109/VLSIC.1989.1037497
Filename :
1037497
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2317558
