DocumentCode

2317702

Title

Jitter analysis of high speed sampling systems

Author

Shinagawa, Mitsuru ; Akazawa, Yukio ; Wakimoto, Tsutomu

Author_Institution

NTT LSI Laboratories

fYear

1989

fDate

25-27 May 1989

Firstpage

95

Lastpage

96

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Circuits, 1989. Digest of Technical Papers., 1989 Symposium on

Conference_Location

Kyoto, Japan

Type

conf

DOI

10.1109/VLSIC.1989.1037506

Filename

1037506