Title :
On-board preventive maintenance for long-life deep-space missions: a model-based analysis
Author :
Tai, Ann T. ; Alkalai, Leon ; Chau, Savio N.
Author_Institution :
IA Tech. Inc., Los Angeles, CA, USA
Abstract :
The long-life deep-space missions associated with NASA´s X2000 Advanced Flight Systems Program creates many unprecedented challenges. In particular the stringent constraints on the mass of a spacecraft and the power on-board preclude traditional fault tolerance approaches which rely on extensive component/subsystem replication, calling for novel approaches to mission reliability enhancement. In this paper we present an approach to on-board preventive maintenance which rejuvenates a system via periodical duty switching between system components, slowing down a system´s aging process and enhancing mission reliability. By exploiting the nondedicated system redundancy hardware and software rejuvenation are realized simultaneously without significant performance penalty. Our model-based evaluation confirms a potential for significant gains in mission reliability from on-board preventive maintenance and provides to us useful insights about the collective effect of age-dependent failure behavior residual mission life, risk of unsuccessful maintenance and maintenance frequency on mission reliability
Keywords :
aerospace computing; aerospace instrumentation; fault tolerant computing; NASA´s X2000 Advanced Flight Systems Program; aging process; fault tolerance approaches; long-life deep-space missions; mission reliability; mission reliability enhancement; model-based analysis; model-based evaluation; nondedicated system redundancy hardware; on-board preventive maintenance; software rejuvenation; spacecraft; Aging; Hardware; Laboratories; Mars; NASA; Preventive maintenance; Propulsion; Space technology; Space vehicles; Thermal force;
Conference_Titel :
Computer Performance and Dependability Symposium, 1998. IPDS '98. Proceedings. IEEE International
Conference_Location :
Durham, NC
Print_ISBN :
0-8186-8679-0
DOI :
10.1109/IPDS.1998.707722