Title :
LMIS cusp length as a function of emission current: a review of experimental and theoretical results
Author :
Forbes, Richard G. ; Mair, Graeme L R
Author_Institution :
Sch. of Electron. Eng., Surrey Univ., Guildford, UK
Abstract :
The cusp length of an operating liquid-metal ion source (LMIS) is of interest, since this may affect source stability with respect to the emission of liquid droplets. Some years ago, Mair and Forbes (1991,92) derived a formula that relates the length of the cusp of a liquid metal ion source to the ion emission current. Since our theory was originally published there have been several new experiments on a wider range of materials than we originally considered. So it has seemed useful to compare experiment and theory for most of the data now available.
Keywords :
liquid metal ion sources; LMIS cusp length; ion emission current; liquid metal ion source; Atomic beams; Atomic measurements; Charge measurement; Current measurement; Indium; Ion emission; Ion sources; Laboratories; Stability; Voltage control;
Conference_Titel :
Vacuum Microelectronics Conference, 1998. Eleventh International
Conference_Location :
Asheville, NC, USA
Print_ISBN :
0-7803-5096-0
DOI :
10.1109/IVMC.1998.728616
