DocumentCode
2317819
Title
Theoretical estimations of FEA´s reliability
Author
Golubentsev, A.F. ; Anikin, V.M.
Author_Institution
Dept. of Phys., Saratov State Univ., Russia
fYear
1998
fDate
19-24 July 1998
Firstpage
21
Lastpage
22
Abstract
Some peculiarities of the field emission from micro- and nano-structural FEAs (e.g., a random FEA structure, a random multistable current from a single emissive center) are investigated using various Markov probabilistic models for the theoretical description of fluctuation phenomena in the field emission and reliability properties of the electron sources.
Keywords
Markov processes; electron field emission; failure analysis; fluctuations; probability; reliability theory; statistical analysis; vacuum microelectronics; FEA reliability; Markov probabilistic models; electron sources; failure probability; field emission; field emitter arrays; fluctuation phenomena; microstructural FEA; nanostructural FEA; random multistable current; reliability properties; statistical emission models; Cathodes; Context modeling; Electron sources; Equations; Estimation theory; Fluctuations; Physics; Probability; Random processes; Reliability theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 1998. Eleventh International
Conference_Location
Asheville, NC, USA
Print_ISBN
0-7803-5096-0
Type
conf
DOI
10.1109/IVMC.1998.728618
Filename
728618
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