DocumentCode :
2317890
Title :
A VLSI circuit for recreating living nerve networks
Author :
Wolpert, Seth ; Laffely, A.J. ; Fern, Alan
Author_Institution :
Dept. of Electr. & Comput. Eng., Maine Univ., Orono, ME, USA
fYear :
1995
fDate :
22-23 May 1995
Firstpage :
86
Lastpage :
88
Abstract :
Using conventional CMOS VLSI technology, a comprehensive neuromime circuit has been implemented based on the discrete model by French and Stein (1970). The circuit occupies under 0.5 mm2 of die area, plus a few passive biasing components, and offers continuously variable excitatory and inhibitory sensitivity refractoriness, and operating rate. The implementation provides free and continuous access to waveforms for membrane and threshold potentials. As such, it is amenable to many secondary behavioral characteristics, such as fatigue, postinhibitory rebound, accommodation, and facilitation. In VLSI form, it provides the economy, comprehensiveness, reliability, efficiency and convenience to support larger networks of artificial nerve cells
Keywords :
CMOS analogue integrated circuits; VLSI; biomedical electronics; neural chips; neurophysiology; VLSI circuit; accommodation; artificial nerve cells; comprehensive neuromime circuit; comprehensiveness; continuously variable excitatory sensitivity refractoriness; convenience; conventional CMOS VLSI technology; die area; discrete model; economy; efficiency; facilitation; fatigue; inhibitory sensitivity refractoriness; living nerve networks; membrane potentials; operating rate; passive biasing components; postinhibitory rebound; reliability; secondary behavioral characteristics; threshold potentials; waveforms; Biomembranes; CMOS technology; Cells (biology); Electronic circuits; FETs; Fatigue; Packaging; Semiconductor device modeling; Testing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bioengineering Conference, 1995., Proceedings of the 1995 IEEE 21st Annual Northeast
Conference_Location :
Bar Harbor, ME
Print_ISBN :
0-7803-2692-X
Type :
conf
DOI :
10.1109/NEBC.1995.513744
Filename :
513744
Link To Document :
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