DocumentCode
2317944
Title
Photoelectric workfunctions of metals oxide films and emission characteristics of molybdenum emitter tips with oxide coatings
Author
Bernhard, J.M. ; Rouse, A. ; Sosa, E.D. ; Golden, D.E. ; Chalamala, B.R. ; Aggarwal, S. ; Gnade, B.E ; Ramesh, R.
Author_Institution
Dept. of Phys., North Texas Univ., Denton, TX, USA
fYear
1998
fDate
19-24 July 1998
Firstpage
32
Lastpage
33
Abstract
Photoelectric work functions of flat thin metal oxides of interest as potential field emission sources for field emission displays have been measured using ultraviolet photoelectron spectroscopy. The samples which include molybdenum, lanthanum strontium cobalt oxide, lead zirconium titanate, lead niobium zirconium titanate have also been characterized with X-ray photoelectron spectroscopy and X-ray diffraction spectroscopy. In addition, field emission measurements have been made with molybdenum and molybdenum coated field emission tips using single tip-gated aperture diodes mounted on a micromechanical motion control system. In these measurements, an electron decelerating lens and a hemispherical electron spectrometer is positioned behind the gated aperture so field emitted electrons passing through the aperture may be decelerated and their energy distribution measured. The emission characteristics and electron energy distributions were measured at different electric field strengths to determine the range of validity of the Fowler-Nordheim equation for the various emitter surfaces.
Keywords
X-ray diffraction; X-ray photoelectron spectra; electron field emission; molybdenum; photoemission; ultraviolet photoelectron spectra; work function; Fowler-Nordheim equation; LaSrCoO; Mo; PZT; PbNbZrTiO/sub 3/; PbZrO3TiO3; X-ray diffraction; X-ray photoelectron spectroscopy; electron energy distribution; field emission; metal oxide film; molybdenum emitter tip; oxide coating; photoelectric work function; ultraviolet photoelectron spectroscopy; Apertures; Electron emission; Energy measurement; Flat panel displays; Lanthanum; Lead compounds; Position measurement; Spectroscopy; Titanium compounds; Zirconium;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 1998. Eleventh International
Conference_Location
Asheville, NC, USA
Print_ISBN
0-7803-5096-0
Type
conf
DOI
10.1109/IVMC.1998.728624
Filename
728624
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