Title :
Recognition of the multi-specularity objects using the eigen-window
Author :
Ohba, Kohtaro ; Ikeuchi, Katsushi
Author_Institution :
Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
This paper describes a method for recognizing partially occluded specularity objects for bin-picking tasks using the eigen-space analysis. Although effective in recognizing an isolated object, as was shown by Murase and Nayar, the current method can not be applied to partially occluded objects that are typical in bin-picking tasks. The analysis also requires that the object is centered in an image before recognition. These limitations of the eigen-space analysis are due to the fact that the whole appearance of an object is utilized as a template for the analysis. We propose a new method, referred to as the “eigen-window” method, that stores multiple partial appearances of an object in the eigen-space. Such partial appearances require a large number of memory space. To reduce the memory requirement by avoiding redundant windows and to select only effective windows to be stored, a similarity measure among windows is developed. Using a pose clustering method among windows, the method determines the pose of an object. We have implemented the method and verify the validity of the method
Keywords :
computer vision; eigenvalues and eigenfunctions; image matching; object recognition; bin-picking tasks; computer vision; eigen-window method; eigenvalues; eigenvectors; image matching; memory space; multiple specularity object recognition; partially occluded objects; pose clustering; similarity measure; Clustering methods; Computer science; Covariance matrix; Eigenvalues and eigenfunctions; History; Image analysis; Image recognition; Learning systems; Matrix converters; Power system modeling;
Conference_Titel :
Pattern Recognition, 1996., Proceedings of the 13th International Conference on
Conference_Location :
Vienna
Print_ISBN :
0-8186-7282-X
DOI :
10.1109/ICPR.1996.546113