Title :
5" full color field emission displays with narrow vacuum gap studies
Author :
Kim, J.M. ; Jung, J.E. ; Park, N.S. ; Ryu, Y.S. ; Park, Y.J. ; Cha, N.S.
Author_Institution :
Samsung Adv. Inst. of Technol., Suwon, South Korea
Abstract :
The extensive electron trajectory profiling are simulated for the best confinement of electron movement. The different kinds of spacers with high aspect ratio are fabricated and compared for high vacuum packaging with the yield effects. The extensive residual gas characterizations are fully analyzed during packaging and electrical activation. Gas curing steps are fully demonstrated for stabilizing the anode and cathode. The surface condition at micro tips by oxidation effect and phosphor effect are investigated. 5" full color images are demonstrated with the above results at the anode bias of 250 volts and the gate voltage of 75 volts.
Keywords :
colour displays; field emission displays; 250 V; 5 in; 75 V; aspect ratio; electrical activation; electron trajectory; full color field emission display; gas curing; microtip; oxidation; packaging; phosphor; residual gas; simulation; spacer; vacuum gap; yield; Anodes; Cathodes; Color; Curing; Electrons; Flat panel displays; Oxidation; Packaging; Phosphors; Voltage;
Conference_Titel :
Vacuum Microelectronics Conference, 1998. Eleventh International
Conference_Location :
Asheville, NC, USA
Print_ISBN :
0-7803-5096-0
DOI :
10.1109/IVMC.1998.728628
