DocumentCode
2318036
Title
Characterization of the TEVATRON electron lens magnetic system
Author
Bishofberger, K. ; Shiltsev, Vladimir ; Kozub, S. ; Krotov, N. ; Sytnik, V. ; Tikhov, A. ; Tkachenko, L.
Author_Institution
UCLA, Los Angeles, CA
Volume
5
fYear
2001
fDate
2001
Firstpage
3406
Abstract
The Tevatron Electron Lens (TEL) installed in the Tevatron at FNAL bends a 10-keV electron beam into and out of the antiproton path. The stringent requirements of the electron beam path demand extremely straight magnetic field lines over roughly two meters which then bend away to the gun and collector. A 6-Tesla superconducting solenoid and two normal-conducting solenoids, supplemented with several dipole and quadrupole correctors, were constructed at IHEP and subsequently assembled and tested at FNAL. Several testing methods, with an resolution of approximately 2 grad, confirmed the field profile to match computer models and meet necessary constraints. Visual inspection of the beam position and size on screens confirmed the measurements. This paper analyzes these results and relates them to the system requirements
Keywords
accelerator magnets; electromagnets; electron accelerators; electron beam focusing; electron beams; electron guns; electron optics; particle beam diagnostics; proton accelerators; superconducting magnets; synchrotrons; 10 keV; 6 T; FNAL; Hall probe apparatus; IHEP; TEL; Tevatron electron lens magnetic system; antiproton beam; beam position; beam size; computer models; electron beam; electron collector; electron gun; field profile; normal-conducting solenoids; quench protection circuit; straight magnetic field lines; superconducting solenoid; visual inspection; Assembly; Electron beams; Inspection; Lenses; Magnetic field measurement; Magnetic fields; Position measurement; Solenoids; Superconducting magnets; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
Conference_Location
Chicago, IL
Print_ISBN
0-7803-7191-7
Type
conf
DOI
10.1109/PAC.2001.988126
Filename
988126
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