DocumentCode
2318278
Title
Reliability and interval estimation of type-H censored electrical insulation data
Author
Shetty, Pradeep Kumar ; Ramu, T.S.
Author_Institution
Dept. of High Voltage Eng., Indian Inst. of Sci., Bangalore, India
fYear
2004
fDate
19-22 Sept. 2004
Firstpage
402
Lastpage
405
Abstract
The paper presents some analytical results pertaining to the estimation of variance of the parameters of a three parameter Weibull distribution (3pW) under type-II censoring. Ageing failure data acquired on an insulating material of considerable application potential has been used to demonstrate the results. The point estimates of the parameters of failure time distribution are obtained using maximum likelihood estimation method. The true value of the variance of the ML estimates for 3pW are hard to obtain and the situation becomes more complex when the data is censored. The asymptotic variance can be obtained by taking the inverse of the Fisher information matrix, the computation of which is quite involved in the case of censored 3-pW data. Approximations are reported in the literature to simplify the procedure. The authors have considered the effects of such approximations on the precision of variance estimates when the sample size is greatly limited by practical difficulties in obtaining the authentic data. A detailed study of the effect of censoring on the ML estimates, under this condition is also presented.
Keywords
Weibull distribution; ageing; failure analysis; insulating materials; insulation testing; matrix inversion; maximum likelihood estimation; power apparatus; reliability; Fisher information matrix inverse; ageing failure data; asymptotic variance; failure time distribution; insulating material; interval estimation; maximum likelihood estimation; reliability; three parameter Weibull distribution; type-H censored electrical insulation data; type-II censoring; Costs; Data analysis; Data engineering; Dielectrics and electrical insulation; Failure analysis; Parameter estimation; Probability; Reliability engineering; Thermal stresses; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation, 2004. Conference Record of the 2004 IEEE International Symposium on
ISSN
1089-084X
Print_ISBN
0-7803-8447-4
Type
conf
DOI
10.1109/ELINSL.2004.1380614
Filename
1380614
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