• DocumentCode
    2318294
  • Title

    Traceability to national standards for S-parameter measurements in waveguide at frequencies from 140 GHz to 220 GHz

  • Author

    Ridler, Nick ; Clarke, Roland ; Salter, Martin ; Wilson, Alan

  • Author_Institution
    Nat. Phys. Lab., Teddington, UK
  • fYear
    2010
  • fDate
    Nov. 30 2010-Dec. 3 2010
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    This paper describes a new facility that has been introduced recently to provide high precision traceable scattering parameter measurements of waveguide devices in the frequency range 140 GHz to 220 GHz (i.e. in waveguide size WR-05). The facility comprises measurement instrumentation situated at the University of Leeds and associated primary reference standards provided by the National Physical Laboratory. The instrumentation consists of a Vector Network Analyzer (VNA) and the standards are precision sections of waveguide that are used to calibrate the VNA. Traceability to national standards and the International System of units (SI) is achieved via precision dimensional measurements of the waveguide sections. Typical measurements, with uncertainties, are given to illustrate the current state-of-the-art for traceable measurements of this type.
  • Keywords
    millimetre wave measurement; network analysers; precision engineering; S-parameter measurement; frequency 140 GHz to 220 GHz; frequency range; measurement instrumentation; national standards; precision dimensional measurement; precision traceable scattering parameter measurement; traceability; vector network analyzer; waveguide device; Vector network analysis; calibration and measurement; millimeter-waves; traceability to national standards; waveguides;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Symposium (ARFTG), 2010 76th ARFTG
  • Conference_Location
    Clearwater Beach, FL
  • Print_ISBN
    978-1-4244-7447-9
  • Type

    conf

  • DOI
    10.1109/ARFTG76.2010.5700046
  • Filename
    5700046