Title :
Test education for VLSI systems design engineers
Author :
Agrawal, Vishwani D.
Author_Institution :
Bell Labs., Lucent Technol., Murray Hill, NJ, USA
Abstract :
The implementation of entire systems on VLSI chips provides an opportunity for a top-down test strategy. This is possible if the systems designer is familiar with the basic concepts in test, design for testability, and system diagnosis. The paper proposes a two-step education program. The first coarse, “Essentials of Electronic Testing ”, teaches the basic principles of testing. It is an undergraduate-level course and should be included in the core curriculum in addition to a VLSI design course. The second course, “Advanced Concepts in VLSI Testing”, is a graduate-level course. It is useful for VLSI CAD engineers and for researchers
Keywords :
VLSI; educational courses; electronic engineering education; integrated circuit testing; VLSI systems design engineers; VLSI testing; electronic testing; graduate-level course; test education; top-down test strategy; two-step education program; undergraduate-level course; Circuit faults; Circuit testing; Design engineering; Design for testability; Electronic equipment testing; Logic testing; System testing; Systems engineering and theory; Systems engineering education; Very large scale integration;
Conference_Titel :
VLSI '98. System Level Design. Proceedings. IEEE Computer Society Workshop on
Conference_Location :
Orlando, FL
Print_ISBN :
0-8186-8448-8
DOI :
10.1109/IWV.1998.667117
