• DocumentCode
    2318311
  • Title

    Terahertz pulse emission from strained GaN/GaInN quantum well structures

  • Author

    Turchinovich, Dmitry ; Walther, Markus ; Helm, Hanspeter ; Koch, Martin ; Lahmann, Sandra ; Hangleiter, Andreas ; Jepsen, Peter Uhd

  • Author_Institution
    Dept. of Molecular & Opt. Phys., Freiburg Univ., Germany
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    63
  • Lastpage
    66
  • Abstract
    Efficient THz pulse generation from optically pumped InGaN/GaN multiple quantum well structures is demonstrated. Such structures incorporate strong electric fields of opposite directions - piezoelectric fields inside the quantum wells and in the barrier. Polarized states inside the quantum well and in the barrier give different contributions to the THz pulse, depending on whether the excitation is real or virtual. If the excitation energy is slightly below the e1-h1 transition in the quantum well, two-photon absorption in the barriers is observed to give the dominant contribution to the THz generation process at high pump fluence. At low pump fluence the virtual excitation of polarized states inside the quantum well dominates.
  • Keywords
    III-V semiconductors; gallium compounds; indium compounds; infrared spectra; light polarisation; optical pumping; piezoelectric semiconductors; semiconductor quantum wells; submillimetre wave generation; time resolved spectra; two-photon processes; GaN-GaInN; THz pulse generation; excitation energy; instantaneous polarization; optically pumped multiple quantum well structures; piezoelectric fields; polarized states; strained GaN/GaInN quantum well structures; strong electric fields; terahertz pulse emission; two-photon absorption; virtual excitation; Gallium nitride; Nonlinear optics; Optical polarization; Optical pulse generation; Optical pulses; Optical pumping; Quantum well devices; Spectroscopy; Stimulated emission; Ultrafast optics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Terahertz Electronics Proceedings, 2002. IEEE Tenth International Conference on
  • Print_ISBN
    0-7803-7630-7
  • Type

    conf

  • DOI
    10.1109/THZ.2002.1037590
  • Filename
    1037590