DocumentCode :
2318315
Title :
Comparison of 1.85mm line reflect line and offset short calibration
Author :
Hoffmann, Johannes Paul ; Ruefenacht, Juerg ; Wollensack, Michael ; Zeier, Markus
Author_Institution :
METAS Swiss Fed. Office of Metrol., Bern-Wabern, Switzerland
fYear :
2010
fDate :
Nov. 30 2010-Dec. 3 2010
Firstpage :
1
Lastpage :
7
Abstract :
This paper shows how the S-parameters in 1.85 mm coaxial line systems can be defined in a traceable way. It is found that a very fail-proof verification method is to compare two different and independent calibration techniques. Here a line reflect line method is compared to an offset short calibration. Measurements of a load, which were corrected with both calibrations, showed an agreement which was better than 0.003 in linear S-parameters up to 67 GHz. Key factors for achieving this accuracy are the taking into account of connector effects and the setting of pin gaps to defined values with dielectric rings.
Keywords :
S-parameters; calibration; coaxial cables; electric connectors; millimetre wave measurement; network analysers; S-parameter; coaxial connector; coaxial line system; dielectric ring; fail-proof verification method; frequency 67 GHz; line reflect line method; offset short calibration; size 1.85 mm; vector network analyzer; Calibration; Calibration Standards; Coaxial Connectors; S-parameters; Vector Network Analyzer;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Symposium (ARFTG), 2010 76th ARFTG
Conference_Location :
Clearwater Beach, FL
Print_ISBN :
978-1-4244-7447-9
Type :
conf
DOI :
10.1109/ARFTG76.2010.5700047
Filename :
5700047
Link To Document :
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