Title :
Noise figure and S-parameter measurement setups for on-wafer differential 60GHz circuits
Author :
Sakian, Pooyan ; Janssen, Erwin ; Essing, Jaap ; Mahmoudi, Reza ; Van Roermund, Arthur
Author_Institution :
Dept. of Electr. Eng., Eindhoven Univ. of Technol., Eindhoven, Netherlands
fDate :
Nov. 30 2010-Dec. 3 2010
Abstract :
On-wafer measurement setups are introduced for measuring the noise figure and s-parameters of differential 60GHz circuits. The need for expensive four-port mm-wave vector network analyzers is circumvented by using magic-Ts, providing a minimum CMRR of 20dB, in combination with cheaper two-port mm-wave network analyzers. Waveguide interfaces are used in the vicinity of the RF probes to achieve a robust and repeatable setup, as the cables at mm-wave frequencies are prone to impedance and delay variation due to movement and bending. The noise figure of a double-balanced 60GHz mixer and the noise figure and s-parameters of a differential 60GHz LNA are measured using this setup and the measurement results are in good agreement with the simulations.
Keywords :
S-parameters; differential amplifiers; low noise amplifiers; millimetre wave amplifiers; millimetre wave mixers; network analysers; CMRR; LNA; RF probes; S-parameter measurement set up; delay variation; double-balanced mixer; four-port mm-wave vector network analyzers; frequency 60 GHz; impedance variation; magic-T; noise figure; on-wafer differential circuits; waveguide interfaces; 60GHz; differential; measurement; mm-wave; noise figure; s-parameter;
Conference_Titel :
Microwave Measurement Symposium (ARFTG), 2010 76th ARFTG
Conference_Location :
Clearwater Beach, FL
Print_ISBN :
978-1-4244-7447-9
DOI :
10.1109/ARFTG76.2010.5700051