DocumentCode
2318648
Title
Design of Tie Line Tripping and Load Shedding Scheme for Distribution Microgrid System with Wind Power Generation
Author
Chen, C.S. ; Hsu, C.T. ; Lin, Y.J. ; Chuang, H.J. ; Ju, Y.J.
Author_Institution
Dept. of Electr. Eng., I-Shou Univ., Kaohsiung, Taiwan
fYear
2009
fDate
4-8 Oct. 2009
Firstpage
1
Lastpage
6
Abstract
This paper is to study the enhancement of power system quality for distribution feeders with wind generator (WG) by applying the static synchronous compensator (STATCOM) to provide the voltage support during fault contingency. The critical clearing time for circuit breaker tripping to isolate the fault is derived by considering the low voltage ride through capability of WG and the reactive power compensation by STATCOM system. To restore the stable operation of the microgrid after the fault transient disturbance, an adaptive load shedding scheme is proposed to disconnect proper amount of nonessential loads according to the feeder loading and wind speed to prevent the tripping of WG due to under frequency constraint. A Taipower distribution system has been selected for computer simulation to verify the effectiveness of the proposed strategy of feeder CB tripping and load shedding to improve the power system stability of distribution feeder with wind generator.
Keywords
distributed power generation; load shedding; power distribution faults; power system stability; static VAr compensators; wind power plants; STATCOM system; adaptive load shedding scheme; circuit breaker tripping; distribution microgrid system; fault transient disturbance; feeder loading; power system quality distribution feeders; power system stability; static synchronous compensator; tie line tripping design; wind power generation; wind speed; Automatic voltage control; Circuit breakers; Circuit faults; Low voltage; Power generation; Power system faults; Reactive power; Synchronous generators; Wind energy generation; Wind power generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Society Annual Meeting, 2009. IAS 2009. IEEE
Conference_Location
Houston, TX
ISSN
0197-2618
Print_ISBN
978-1-4244-3475-6
Electronic_ISBN
0197-2618
Type
conf
DOI
10.1109/IAS.2009.5324859
Filename
5324859
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